Title :
System level DSP synthesis using voltage overscaling, unequal error protection & adaptive quality tuning
Author :
Karakonstantis, Georgios ; Mohapatra, Debabrata ; Roy, Kaushik
Author_Institution :
ECE Sch., Purdue Univ., West Lafayette, IN, USA
Abstract :
In this paper, we propose a system level design approach considering voltage over-scaling (VOS) that achieves error resiliency using unequal error protection of different computation elements, while incurring minor quality degradation. Depending on user specifications and severity of process variations/channel noise, the degree of VOS in each block of the system is adaptively tuned to ensure minimum system power while providing ldquojust-the-rightrdquo amount of quality and robustness. This is achieved, by taking into consideration system level interactions and ensuring that under any change of operating conditions only the ldquoless-crucialrdquo computations, that contribute less to block/system output quality, are affected. The design methodology applied to a DCT/IDCT system shows large power benefits (up to 69%) at reasonable image quality while tolerating errors induced by varying operating conditions (VOS, process variations, channel noise). Interestingly, the proposed IDCT scheme conceals channel noise at scaled voltages.
Keywords :
circuit noise; circuit tuning; digital signal processing chips; integrated circuit design; logic design; low-power electronics; power aware computing; IDCT system; adaptive quality tuning; channel noise; error resiliency; image quality; process variation; quality degradation; system level DSP synthesis; system level design; system level interaction; system power; unequal error protection; voltage overscaling; Degradation; Design methodology; Digital signal processing; Discrete cosine transforms; Error correction codes; Image quality; Noise robustness; Power system protection; System-level design; Voltage; Low power; error resilient; supply voltage scaling;
Conference_Titel :
Signal Processing Systems, 2009. SiPS 2009. IEEE Workshop on
Conference_Location :
Tampere
Print_ISBN :
978-1-4244-4335-2
Electronic_ISBN :
1520-6130
DOI :
10.1109/SIPS.2009.5336238