Title :
Proceedings: International Conference on Wafer Scale Integration (IEEE Cat. No.89CH2680-7)
Abstract :
The following topics are dealt with: wafer-sale integration (WSI) directions, WSI development programs; WSI architectures; circuits and technology; fault tolerance and testing
Keywords :
VLSI; integrated circuit technology; integrated circuit testing; WSI; architectures; circuits; development programs; fault tolerance; technology; testing; wafer-sale integration;
Conference_Titel :
Wafer Scale Integration, 1989. Proceedings., [1st] International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-9901-9
DOI :
10.1109/WAFER.1989.47571
