DocumentCode :
2443868
Title :
A CUSUM Chart for Monitoring an Attribute Event
Author :
He, Zhen ; Liu, Yafen ; Zhang, Min
Author_Institution :
Sch. of Manage., Tianjin Univ., Tianjin, China
fYear :
2010
fDate :
7-9 May 2010
Firstpage :
2607
Lastpage :
2610
Abstract :
This article proposes a CUSUM chart, called the R-CUSUM chart, for the monitoring of a negative event. This chart is developed using a Markov model. It is able to check both the time interval (T) between occurrences of the event and the size (C) of each occurrence. Our studies show that the R-CUSUM chart is more effective than the existing R (=C/T) chart for event monitoring. The improvement in performance is achieved because of the use of the CUSUM feature. The R-CUSUM chart can be applied in manufacturing systems, and especially in non-manufacturing sectors (e.g., health care industry, disaster management, and security control).
Keywords :
Markov processes; control charts; Markov model; R-CUSUM chart; attribute event monitoring; disaster management; health care industry; manufacturing systems; negative event monitoring; nonmanufacturing sectors; security control; Control charts; Helium; Markov processes; Monitoring; Process control; Steady-state; Markov chain; quality control; statistical process control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Business and E-Government (ICEE), 2010 International Conference on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3997-3
Type :
conf
DOI :
10.1109/ICEE.2010.659
Filename :
5593111
Link To Document :
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