Title :
An Ultrasonic Method for the Evaluation of Multiphase Binary Diffusion
Author :
Ronen, Z. ; Rokhlin, S. ; Dariel, M.P.
Keywords :
Absorption; Diffusion bonding; Frequency; Impedance; Intermetallic; Optical reflection; Signal analysis; Silicon; Solids; Ultrasonic imaging;
Conference_Titel :
1980 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1980.197559