Title :
Two Post-Irradiation Temperature Techniques for Total Ionizing Dose
Author :
Campola, Michael J. ; Chen, Dakai ; LaBel, Kenneth A.
Author_Institution :
MEI Technol., Inc., Greenbelt, MD, USA
Abstract :
Data have been obtained using two methods that illustrate limitations of cold temperature storage to prevent annealing, and responses to post irradiation elevated temperature tests. Radiation testing was done using a Co60 Source.
Keywords :
aerospace instrumentation; annealing; radiation hardening (electronics); Co60 Source; annealing; cold temperature storage; space radiation environment; total ionizing dose; two-post-irradiation temperature techniques; Annealing; CMOS process; Guidelines; Ice; NASA; Performance evaluation; Temperature distribution; Temperature measurement; Testing; Time factors;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336296
