Title :
Single Event Effects Tests on the Actel RTAX2000S FPGA
Author :
George, Jeffrey S. ; Koga, Rocky ; Zakrzewski, Mark
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
We present new single event effects testing results for the RTAX2000S field-programmable-gate-array. We tested sequential and combinational logic structures, input/output blocks, and embedded RAM with ions and protons.
Keywords :
DRAM chips; aerospace instrumentation; field programmable gate arrays; ion beam effects; proton effects; radiation hardening (electronics); actel RTAX2000S FPGA; combinational logic structure; embedded RAM; field-programmable-gate-array; input-output blocks; ion effects; proton effects; sequential logic structure; single event effects tests; Aerospace testing; CMOS logic circuits; Circuit testing; Clocks; Connectors; Field programmable gate arrays; Logic devices; Logic programming; Logic testing; NASA;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336298
