Title :
LEON 3FT Processor Radiation Effects Data
Author :
Hafer, C. ; Griffith, S. ; Guertin, S. ; Nagy, J. ; Sievert, F. ; Gaisler, J. ; Habinc, S.
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
Special SEU test software is used to monitor the single-bit per word corrected errors in the internal SRAM of the LEON 3 fault tolerant processor. SEL and TID results are discussed.
Keywords :
SRAM chips; fault tolerance; program processors; radiation effects; LEON 3FT processor radiation effects; SEL; SEU test software; TID; fault tolerant processor; internal SRAM; single event latchup; single-bit per word corrected errors; total ionizing dose; Fault tolerance; Monitoring; Protection; Radiation effects; Random access memory; Registers; Single event upset; Springs; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336299
