Title :
Single Event Upset Characterization of the TMS320C6713 Digital Signal Processor Using Proton Irradiation
Author :
Hiemstra, David M.
Author_Institution :
MDA, Brampton, ON, Canada
Abstract :
The proton induced SEU cross-section of the TMS320C6713 digital signal processor´s functional blocks are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.
Keywords :
CMOS integrated circuits; digital signal processing chips; integrated circuit testing; proton effects; radiation hardening (electronics); spacecraft computers; SEU cross-section; TMS320C6713 digital signal processor; critical computer systems; functional blocks; proton irradiation; radiation hardening; single event upset; space radiation environment; Circuit testing; Digital signal processing; Digital signal processors; Logic devices; Logic testing; Performance evaluation; Protons; Random access memory; SDRAM; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336300
