Title :
Single Event Transient (SET) Response of National Semiconductor´s ELDRS-Free LM139 Quad Comparator
Author :
Kruckmeyer, Kirby ; Buchner, Stephen P. ; DasGupta, Sandeepan
Author_Institution :
Nat. Semicond., Santa Clara, CA, USA
Abstract :
Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor´s LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results.
Keywords :
aerospace instrumentation; bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; radiation hardening (electronics); 5692R9673802VxA; LM139AxLQMLV; National Semiconductor´s ELDRS-free LM139 quad comparator; SET testing; bipolar analog products; heavy ion SET; pulsed laser SET; single event transient response; space environment; Assembly; Fabrication; Manufacturing processes; Optical pulses; Packaging; Power supplies; Resistors; Semiconductor device manufacture; Semiconductor lasers; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336313
