• DocumentCode
    2445073
  • Title

    Low cost arrangements for scale model RCS and pattern measurements

  • Author

    Eskelinen, Pekka ; Harju, Petteri

  • Author_Institution
    Lappeenranta Univ. of Technol., Finland
  • Volume
    2
  • fYear
    1997
  • fDate
    14-18 Jul 1997
  • Firstpage
    827
  • Abstract
    Cost-effective RCS and radiation pattern measurements are possible with scale models of original targets using frequencies up to 20 GHz when construction efforts are focused at relevant details and requirements of increased conductivity are not exaggerated. Aluminium foil and copper tape work well as coating surface whereas many foam based plastics are readily usable as transparent structures. Most pattern measurements can be performed at one sixth of the far field limit with less than 1 dB error and even RCS tests give reasonable views on critical locations of the design within similar distances. Here uncertainties below 3 dB are readily achievable though fringing patterns require heavy mathematical post-processing. A suitable combination of target scale reduction, generally below 1:20, often enables the use of both modest X to Ku band frequencies, medium sized rotators for targets lighter than 10 kg and indoor test ranges with path distances under 10 meters
  • Keywords
    aerospace simulation; aerospace test facilities; airborne radar; anechoic chambers; radar antennas; radar cross-sections; radar tracking; search radar; 20 GHz; airborne radar; anechoic chambers; cost-effective measurement; fringing patterns; low cost arrangements; radiation pattern measurements; scale model radar cross sections; surveillance radar; target scale reduction; test range distance optimization; Airborne radar; Aircraft manufacture; Antenna measurements; Conductivity measurement; Costs; Plastics; Radar cross section; Radio frequency; Tail; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1997. NAECON 1997., Proceedings of the IEEE 1997 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-3725-5
  • Type

    conf

  • DOI
    10.1109/NAECON.1997.622736
  • Filename
    622736