DocumentCode
2445176
Title
Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2003 through 2009
Author
Kenna, Aaron J. ; Rax, Bernard G. ; Thorbourn, Dennis O. ; Harris, Richard D. ; McClure, Steven S.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2009
fDate
20-24 July 2009
Firstpage
32
Lastpage
38
Abstract
Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) tests are being performed at the Jet Propulsion Laboratory on a continual basis to support various upcoming space missions and research and development projects. This compendium summarizes the results of the tests carried out over the last six years.
Keywords
integrated circuit testing; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; ELDRS test; Jet Propulsion Laboratory; TID test; enhanced low dose rate sensitivity test; radiation hardening; space missions; total ionizing dose test; Circuit testing; Ionizing radiation; Laboratories; Microelectronics; NASA; Propulsion; Space missions; Space technology; Telephony; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location
Quebec City, QC
Print_ISBN
978-1-4244-5092-3
Type
conf
DOI
10.1109/REDW.2009.5336319
Filename
5336319
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