Title :
Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Buchner, Stephen P. ; Ladbury, Raymond L. ; Oldham, T.R. ; Kim, Hak S. ; Campola, Michael J. ; Lauenstein, Jean-Marie ; Chen, D. ; Berg, Melanie D. ; Sanders, A.B. ; Marshall, Paul W. ; Marsh
Author_Institution :
MEI Technol. Inc., Greenbelt, MD, USA
Abstract :
We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Keywords :
aerospace instrumentation; radiation effects; NASA; candidate spacecraft electronics; radiation effects; single event effect analysis; single event effect testing; single event effects compendium; Acceleration; Aerospace electronics; Cyclotrons; Laboratories; NASA; Particle beams; Single event upset; Space technology; Space vehicles; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336321
