• DocumentCode
    2445235
  • Title

    Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

  • Author

    O´Bryan, Martha V. ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Buchner, Stephen P. ; Ladbury, Raymond L. ; Oldham, T.R. ; Kim, Hak S. ; Campola, Michael J. ; Lauenstein, Jean-Marie ; Chen, D. ; Berg, Melanie D. ; Sanders, A.B. ; Marshall, Paul W. ; Marsh

  • Author_Institution
    MEI Technol. Inc., Greenbelt, MD, USA
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    15
  • Lastpage
    24
  • Abstract
    We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
  • Keywords
    aerospace instrumentation; radiation effects; NASA; candidate spacecraft electronics; radiation effects; single event effect analysis; single event effect testing; single event effects compendium; Acceleration; Aerospace electronics; Cyclotrons; Laboratories; NASA; Particle beams; Single event upset; Space technology; Space vehicles; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336321
  • Filename
    5336321
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2445235