Title :
2009 REDW [Copyright notice]
Abstract :
The following topics are dealt with: radiation testing for semiconductor devices and candidate spacecraft electronics; total ionizing dose radiation test; single event effect radiation test including single event transient response and single event gate rupture tests; radiation-hardened devices; and low dose rate testing.
Keywords :
radiation hardening (electronics); semiconductor device testing; space vehicle electronics; low dose rate testing; radiation testing; radiation-hardened devices; semiconductor device testing; single event effect radiation test; single event gate rupture tests; single event transient response; spacecraft electronics; total ionizing dose radiation test;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336328
