Title :
2009 REDW Welcome
Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Awards committees; Circuit testing; Detectors; Electronic equipment testing; Integrated circuit testing; NASA; Radiation effects; Space vehicles; Technological innovation; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336329
