DocumentCode :
2445862
Title :
Millimetre-wave vector measurements using multistate reflectometers with diode detectors
Author :
Perkins, M. ; Pollard, R.D.
Author_Institution :
Siemens-Plessey Assessment Services Ltd., Titchfield, UK
fYear :
1990
fDate :
8-10 May 1990
Firstpage :
1037
Abstract :
The use of diode power detection with millimeter-wave multistate reflectometers is described. The nonlinear behavior of the diodes has been linearized, and comparisons with thermistor-based systems show that high-quality vector measurements are produced at Q-band and 94.9 GHz with a significant improvement in measurement speed. The use of a scalar network analyzer and diode detectors to make vector measurements has been demonstrated at W-band, requiring a controlling computer and some waveguide hardware. This would enable swept measurements to be made at a rate of one sweep every 2-3 s. The system works in any waveguide band for which the necessary hardware is available.<>
Keywords :
computerised instrumentation; microwave detectors; microwave measurement; microwave reflectometry; network analysers; swept-frequency reflectometry; 30 to 40 GHz; 94.9 GHz; MM-wave vector measurements; Q-band; W-band; controlling computer; diode detectors; diode power detection; measurement speed; multistate reflectometers; nonlinear behavior; scalar network analyzer; swept measurements; waveguide hardware; Circuits; Diodes; Dynamic range; Envelope detectors; Equations; Frequency; Linearity; Polynomials; Power measurement; Thermistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
Type :
conf
DOI :
10.1109/MWSYM.1990.99757
Filename :
99757
Link To Document :
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