Title :
Side reading study of recording heads
Author :
Su, J.L. ; Kochan Ju ; Lang Vo
Author_Institution :
Almaden Research Center
Keywords :
Degradation; Distortion measurement; Ferrites; Frequency domain analysis; Magnetic heads; Magnetoresistance; Noise reduction; Semiconductor thin films; Signal to noise ratio; Working environment noise;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696438