DocumentCode :
2445899
Title :
Side reading study of recording heads
Author :
Su, J.L. ; Kochan Ju ; Lang Vo
Author_Institution :
Almaden Research Center
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
255
Lastpage :
255
Keywords :
Degradation; Distortion measurement; Ferrites; Frequency domain analysis; Magnetic heads; Magnetoresistance; Noise reduction; Semiconductor thin films; Signal to noise ratio; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696438
Filename :
696438
Link To Document :
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