Title :
Practical power loss simulation analysis for soft switching and hard switching PWM inverters
Author :
Hiraki, Eiji ; Nakaoka, Mutsuo ; Horiuchi, Toshikazu ; Sugawara, Yoshitaka
Author_Institution :
Dept. of Electr. & Electron. Eng., Yamaguchi Univ., Japan
Abstract :
This paper deals with a feasible power loss analysis simulator which can actually estimate the total power losses of three phase voltage source soft-switching inverter as well as hard-switching inverter. To estimate switching power losses and conduction power losses of switching semiconductor power devices; IGBTs, incorporated into the inverters and converters, this practical simulator is based on making use of feasible switching power loss data-based table and conduction power loss table which are accumulated from the measured transient switching operation and periodic steady-state conduction voltage and current operating waveforms of semiconductor switching power devices used in the power converters. The effectiveness of feasible simulation technique and power loss evaluations for power electronic conversion circuits and systems has been confirmed on the basis of simulation and experimental results under the conditions of soft switching and hard switching PWM schemes
Keywords :
PWM invertors; insulated gate bipolar transistors; losses; power semiconductor switches; switching circuits; IGBT; conduction power losses; hard switching PWM inverters; periodic steady-state conduction current; periodic steady-state conduction voltage; power loss analysis simulator; power loss data-based table; soft switching PWM inverter; switching semiconductor power devices; three phase voltage source inverter; transient switching operation; Analytical models; Circuit simulation; Insulated gate bipolar transistors; Phase estimation; Power semiconductor switches; Pulse width modulation; Pulse width modulation inverters; Switching circuits; Switching converters; Voltage;
Conference_Titel :
Power Conversion Conference, 2002. PCC-Osaka 2002. Proceedings of the
Conference_Location :
Osaka
Print_ISBN :
0-7803-7156-9
DOI :
10.1109/PCC.2002.997576