New time domain reflectometry techniques suitable for testing microwave and millimeter wave circuits

Author

Shen, Z.-Y.

Author_Institution

HYPRES Inc., Elmsford, NY, USA

fYear

1990

fDate

8-10 May 1990

Firstpage

1045

Abstract

A superconducting circuit-based time-domain reflectometer with deconvolution has achieved a record 2.5-ps risetime at the device under test´s (DUT´s) interface. The corresponding spatial resolution approaches 0.1 mm for high dielectric media. Examples for applications are given. The tail effect caused by large discontinuities is eliminated by deconvolution. An innovative partial reflection calibration is suggested to improve the resolution for on-chip tests.<>

Keywords

calibration; integrated circuit testing; microwave integrated circuits; microwave reflectometry; reflectometers; strip lines; superconducting integrated circuits; time-domain reflectometry; 2.5 ps; MM-wave circuit testing; deconvolution; device under test interface; high dielectric media; microwave circuit testing; on-chip tests; partial reflection calibration; risetime; spatial resolution; superconducting circuit-based time-domain reflectometer; Calibration; Circuit testing; Deconvolution; Microwave circuits; Microwave theory and techniques; Millimeter wave circuits; Millimeter wave technology; Reflectometry; Spatial resolution; Superconducting transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1990., IEEE MTT-S International

Conference_Location

Dallas, TX

Type

conf

DOI

10.1109/MWSYM.1990.99759

Filename

99759