DocumentCode :
2446297
Title :
Measurement Of The Magnetostriction Constants Of Amorphous Thin Films
Author :
Ouyang, Chunmei ; Kim, Tae Wook ; Gambino, R.J. ; Jahnes, Christopher
Author_Institution :
SUNY at Stony Brook
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
146
Lastpage :
147
Keywords :
Amorphous materials; Iron; Magnetic films; Magnetic flux; Magnetostriction; Saturation magnetization; Soft magnetic materials; Sputtering; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737308
Filename :
737308
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2446297
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