DocumentCode :
2446448
Title :
Tunneling Magnetoresistance and Current Distribution Effect in spin Dependent Tunneling Junctions
Author :
Sun, J.J. ; Sousa, Ricardo C. ; Plaskett, T.S. ; Freitas, P.P.
Author_Institution :
INESC
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
149
Lastpage :
149
Keywords :
Artificial intelligence; Circuits; Current distribution; Electrical resistance measurement; Electrodes; Fabrication; Insulation; Niobium; Oxidation; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737316
Filename :
737316
Link To Document :
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