DocumentCode
2446448
Title
Tunneling Magnetoresistance and Current Distribution Effect in spin Dependent Tunneling Junctions
Author
Sun, J.J. ; Sousa, Ricardo C. ; Plaskett, T.S. ; Freitas, P.P.
Author_Institution
INESC
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
149
Lastpage
149
Keywords
Artificial intelligence; Circuits; Current distribution; Electrical resistance measurement; Electrodes; Fabrication; Insulation; Niobium; Oxidation; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.737316
Filename
737316
Link To Document