DocumentCode :
2446650
Title :
TMR Window and Erase Band Measurements with thin Film Write/MR Read Heads on Metal Particle Tape
Author :
McKinstry, K.D. ; Dee, R.H.
Author_Institution :
Storage Technol. Corp.
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
153
Lastpage :
153
Keywords :
Bit error rate; Coercive force; Magnetic heads; Magnetic noise; Magnetic recording; Particle measurements; Sequential analysis; Signal to noise ratio; Transistors; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737326
Filename :
737326
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2446650
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