Title :
A Description of Complete Offtrack Capability Curve and its Special Application
Author_Institution :
Trace Storage Technol. Corp.
Keywords :
Bit error rate; Coercive force; Magnetic heads; Magnetic noise; Magnetic recording; Particle measurements; Sequential analysis; Signal to noise ratio; Transistors; Writing;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.737328