DocumentCode :
2446732
Title :
Magnetic Force Microscopy Study of Sources of Risidual Overwrite Signal in Longitudinal Thim Film Magnetic Recording Media
Author :
Schabes, M.E. ; Mei, Lin ; Yeh, N.H.
Author_Institution :
Komag Inc.
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
154
Lastpage :
155
Keywords :
Finite element methods; Frequency; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic recording; Magnetization; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737331
Filename :
737331
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2446732
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