• DocumentCode
    2446742
  • Title

    Statistical circuit analysis based on SABER

  • Author

    Li, Dongli ; He, Xiangning ; Zhang, Jin ; Deng, Yan ; Zhao, Rongxiang

  • Author_Institution
    Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    743
  • Abstract
    It is extremely useful for electrical engineers to predict design performance as component parameters deviate from the criterion value randomly. This work can be handled by a circuit simulation software, SABER, which covers powerful statistical analysis including Monte Carlo analysis and worst-case analysis. In the simulation environment of SABER, the circuit statistical analysis at randomly selected device parameters under certain tolerance bounds is illustrated in detail with a flyback convertor and an active band pass filter as examples. Moreover, the simulation wave and statistical summary are presented. Based on the statistical analysis results, the robustness of the circuit is appraised and the proportion of finished product in the batch production is forecasted. Furthermore, the acceptable tolerance bounds on the device parameters are obtained. The work in this paper is a practical guide to high robustness circuit design
  • Keywords
    DC-DC power convertors; Monte Carlo methods; active filters; band-pass filters; circuit simulation; frequency-domain analysis; statistical analysis; time-domain analysis; 15 V; 210.5 Hz; 250 kHz; Monte Carlo analysis; SABER; active band pass filter; batch production; circuit simulation software; circuit statistical analysis; design performance prediction; flyback convertor; frequency-domain statistical analysis; high robustness circuit design; randomly selected device parameters; statistical analysis; time-domain statistical analysis; tolerance bounds; worst-case analysis; Analytical models; Band pass filters; Circuit analysis; Circuit simulation; Converters; Design engineering; Monte Carlo methods; Power engineering and energy; Robustness; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Conversion Conference, 2002. PCC-Osaka 2002. Proceedings of the
  • Conference_Location
    Osaka
  • Print_ISBN
    0-7803-7156-9
  • Type

    conf

  • DOI
    10.1109/PCC.2002.997612
  • Filename
    997612