• DocumentCode
    2446779
  • Title

    Performance of a 2× Cusp concentrator PV module using bifacial solar cells

  • Author

    Ortabasi, Ugur

  • Author_Institution
    DR Technologies Inc., San Diego, CA, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    1177
  • Lastpage
    1181
  • Abstract
    This paper describes the key performance characteristics of a static concentrator called 2X Cusp Concentrator Module (2XCCM). At this low concentration ratio of 2 the module needs only half of the cells required by a conventional flat-plate module. A prototype, using 14% to 14.5% efficient dendritic web bifacial silicon solar cells was completed in 1990 and subsequently subjected to indoor and outdoor testing. The module produced 39.75 watts at 10.9% efficiency when flash tested indoors. Outdoors the module produced 33.1 Watts at 8.75%. The drop in performance was attributed to soiling of the mirrors and cell fractures. The module generated about 60% of its power output from the cells front surface and 40% from the back surface. In most respects the module performed like a flat-plate module except that its operating temperature was somewhat higher. A cost analysis showed that at an improved module efficiency of 12.8%, using 15%/14% bifacial cells and at a cell cost of $1.33/Watt, the module cost coefficient would be $2/Watt
  • Keywords
    elemental semiconductors; semiconductor device testing; silicon; solar cell arrays; solar energy concentrators; 10.9 percent; 12.8 percent; 14 to 14.5 percent; 33.1 W; 39.75 W; 8.75 percent; Cusp concentrator PV module; Si; dendritic web bifacial Si solar cells; flash testing; mirror soiling; operating temperature; performance characteristics; photovoltaic performance; solar cell fractures; Costs; Mirrors; Photovoltaic cells; Power generation; Prototypes; Silicon; Solar power generation; Surface cracks; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654299
  • Filename
    654299