Title :
Dielectric loaded HTS resonators as frequency standards and low phase noise oscillators
Author :
Gallop, J.C. ; Langham, C.D. ; Abbas, F.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
We assess the potential for HTS dielectric loaded resonators as practical frequency standards and reference elements for low phase noise oscillators.
Keywords :
Q-factor; frequency measurement; frequency stability; high-temperature superconductors; measurement standards; microwave measurement; microwave oscillators; phase noise; superconducting cavity resonators; superconducting device noise; 4.2 K; cryogenic temperature stability; dielectric loaded HTSC resonators; frequency stability; frequency standards; loss tangent; low phase noise oscillators; microwave frequencies; quality factor; reference elements; relative permittivity; surface impedance; temperature dependence; Dielectric loss measurement; Dielectric losses; High temperature superconductors; Oscillators; Phase noise; Resonant frequency; Stability; Superconducting device noise; Superconducting microwave devices; Surface impedance;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547072
