Title :
An Acoustic Microscope for Surface Characterization
Author :
Maxfield, Bruce W. ; Weglein, Rolf D.
Keywords :
Acoustic beams; Acoustic measurements; Coatings; Focusing; Frequency; Microscopy; Optical surface waves; Surface acoustic waves; Surface waves; Temperature;
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/ULTSYM.1981.197684