Title :
Transverse correlation length in thin film media
Author :
Guo Mian ; Indeck, R.S. ; Muller, M.W.
Author_Institution :
Washington University
Keywords :
Digital filters; Displacement measurement; Equations; Filtering; Remanence; Signal processing; Transistors; Voltage; Yield estimation;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696444
