Title :
An algebraic approach for test generation in iterative logic networks
Author :
Seghrouchni, M.A. ; Eleuldj, M.
Author_Institution :
Departement Genie Informatique, EMI, Rabat, Morocco
Abstract :
This paper deals with a generalisation of test concepts for iterative logic networks. We present an algebraic approach for test generation in iterative logic networks. The generated test is under the stuck-at fault model [Feng 81b] and the functional fault model [Eleu 88]. Three types of tests are defined : the U-test, NU-test and M-test.
Keywords :
adders; fault diagnosis; iterative methods; logic arrays; logic testing; M-test; NU-test; U-test; algebraic approach; functional fault model; iterative logic networks; stuck-at fault model; test generation; Adders; Circuit faults; Circuit testing; Controllability; Intelligent networks; Iterative methods; Logic arrays; Logic circuits; Logic functions; Logic testing;
Conference_Titel :
Microelectronics, 2001. ICM 2001 Proceedings. The 13th International Conference on
Print_ISBN :
0-7803-7522-X
DOI :
10.1109/ICM.2001.997649
