• DocumentCode
    2447582
  • Title

    An algebraic approach for test generation in iterative logic networks

  • Author

    Seghrouchni, M.A. ; Eleuldj, M.

  • Author_Institution
    Departement Genie Informatique, EMI, Rabat, Morocco
  • fYear
    2001
  • fDate
    29-31 Oct. 2001
  • Firstpage
    217
  • Lastpage
    221
  • Abstract
    This paper deals with a generalisation of test concepts for iterative logic networks. We present an algebraic approach for test generation in iterative logic networks. The generated test is under the stuck-at fault model [Feng 81b] and the functional fault model [Eleu 88]. Three types of tests are defined : the U-test, NU-test and M-test.
  • Keywords
    adders; fault diagnosis; iterative methods; logic arrays; logic testing; M-test; NU-test; U-test; algebraic approach; functional fault model; iterative logic networks; stuck-at fault model; test generation; Adders; Circuit faults; Circuit testing; Controllability; Intelligent networks; Iterative methods; Logic arrays; Logic circuits; Logic functions; Logic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2001. ICM 2001 Proceedings. The 13th International Conference on
  • Print_ISBN
    0-7803-7522-X
  • Type

    conf

  • DOI
    10.1109/ICM.2001.997649
  • Filename
    997649
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2447582