DocumentCode :
244767
Title :
Performance analysis and improvement of JPV primality test for smart IC cards
Author :
Hosung Jo ; Heejin Park
Author_Institution :
Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea
fYear :
2014
fDate :
15-17 Jan. 2014
Firstpage :
271
Lastpage :
275
Abstract :
JPV algorithm, proposed by Joye et al. was predicted to be faster than the combined prime generation algorithm but it runs slower in practice. This discrepancy is because only the number of Fermat test calls was compared in estimating a total running time. We present a probabilistic analysis on the total running time of JPV algorithm. This analysis is very accurate and corresponds to the experiment with only 1-2% error. Furthermore, we propose an improved JPV algorithm that uses Euclid function. It is faster than JPV algorithm and similar to the combined algorithm with the same space requirement.
Keywords :
public key cryptography; smart cards; statistical analysis; Euclid function; Fermat test calls; JPV algorithm; JPV primality test; prime generation algorithm; probabilistic analysis; public-key cryptosystem; smart IC cards; space requirement; Algorithm design and analysis; Probabilistic logic; Public key cryptography; Software algorithms; Time measurement; Tunneling magnetoresistance; Primality test; Prime generation; Public-key cryptosystem;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Big Data and Smart Computing (BIGCOMP), 2014 International Conference on
Conference_Location :
Bangkok
Type :
conf
DOI :
10.1109/BIGCOMP.2014.6741451
Filename :
6741451
Link To Document :
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