Title :
On the reliability of DC-DC power converters
Author :
Shenai, Krishna ; Singh, Prabjit J. ; Rao, Surya ; Sorenson, Dale ; Chu, King ; Gaylon, George
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Abstract :
This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of DC-DC power converters used in computer applications. A full-bridge, phase-shifted zero voltage switching (ZVS) PWM converter was investigated experimentally and theoretically. It is shown that under low-load conditions, the intrinsic body diode of the MOSFET undergoes dynamic avalanching during its reverse recovery with an associated high dV/dt. This phenomenon results in an excessive power loss in the circuit and increased switching stress for the MOSFET. The converter failure under low-load conditions can be associated with this mechanism as one of the potential causes
Keywords :
DC-DC power convertors; PWM power convertors; bridge circuits; power MOSFET; power semiconductor diodes; power semiconductor switches; reliability; switching circuits; DC-DC power converters; MOSFET; converter failure; dynamic avalanching; full-bridge phase-shifted ZVS PM converter; intrinsic body diode; long-term operational reliability; low-load conditions; reliability; reverse recovery; switching stress; zero voltage switching; Bridge circuits; DC-DC power converters; Diodes; Leg; MOSFET circuits; Power MOSFET; Stress; Switches; Transformers; Zero voltage switching;
Conference_Titel :
Energy Conversion Engineering Conference and Exhibit, 2000. (IECEC) 35th Intersociety
Conference_Location :
Las Vegas, NV
Print_ISBN :
1-56347-375-5
DOI :
10.1109/IECEC.2000.870966
