• DocumentCode
    2447974
  • Title

    A new multilevel inverter model NP without clamping diodes

  • Author

    Tehrani, K. Arab ; Rasoanarivo, I. ; Andriatsioharana, H. ; Sargos, F.M.

  • Author_Institution
    Lab. GREEN (Groupe Rech. en Electron. et Electrotech. de Nancy), INPL-Nancy, Nancy
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    466
  • Lastpage
    472
  • Abstract
    This paper deals with a novel multilevel inverter neutral point (MNP). This system consists of a series of monodirectional and bidirectional switch. If one or several bidirectional power switches of this inverter burn out or to become ruined by reason an over voltage or depreciation, it stays in the previous level. Indeed, for a three-level NP to occur a defect in bidirectional switch (middle switch), this system operate in two level mode before detecting defect. In this inverter model, we increase the security and the reliability of the power switches. The originality of this inverter is to remove clamping diodes per phase in comparison with the classical multilevel inverter model neutral point clamped (NPC): e.g. for three phase of an inverter with n-level we removed 6.(n-2) diode-clamp. The advantage of delete all clamping diodes is to decrease the conduction losses. The other originality of this work is a simple command strategy with a low switching frequency. At the end we compare simulated and experimental results.
  • Keywords
    invertors; matrix convertors; power semiconductor switches; switching convertors; bidirectional power switches; clamping diodes; defect detection; matrix inverters; monodirectional power switches; multilevel inverter neutral point; Capacitors; Clamps; Inverters; Laboratories; Matrix converters; Power system modeling; Semiconductor diodes; Switches; Topology; Voltage control; Multilevel inverter; clamping diodes; matrix converter; matrix inverter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4757998
  • Filename
    4757998