DocumentCode :
2447979
Title :
Photoacoustic and Photoluminescence Measurements of Defects in Semiconductors
Author :
Mikoshiba, N. ; Tsubouchi, K.
fYear :
1981
fDate :
14-16 Oct. 1981
Firstpage :
792
Lastpage :
797
Keywords :
Gallium arsenide; Photoluminescence; Piezoelectric films; Piezoelectric transducers; Semiconductor films; Signal detection; Spectroscopy; Sputtering; Temperature; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
Type :
conf
DOI :
10.1109/ULTSYM.1981.197731
Filename :
1534671
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2447979
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