Title :
Automatic generation of motion sequence for error recovery in programmable logic control using plant information
Author :
Aoki, Takeshi ; Suzuki, Tatsuya ; Matsuzaki, M. ; Okuma, Shigeru
Author_Institution :
Nagoya Municipal Ind. Res. Inst., Japan
Abstract :
In this research, we discuss how to automatically generate the motion sequence of actuators for error recovery, including parallel path divergence in the programmable logic control (PLC). Since the sequential path in PLC can be expressed by a state flow, the goal of our research is to find an optimal shortest path from the initial state to the final state. In order to solve this problem, we propose a new search strategy, which consists of two search stages. In the first stage, real-time A* (RTA*) algorithm is used to find a suboptimal sequential path from the initial state to the final state. Based on the suboptimal solutions found by RTA*, the second stage tries to pick up some underlying parallel path divergences among solutions obtained in the first stage. From some simulation results, we have verified that our proposed method could search a suboptimal motion sequence including parallel path divergences with less computational amount.
Keywords :
actuators; computational complexity; industrial control; intelligent control; path planning; programmable controllers; real-time systems; suboptimal control; system recovery; RTA* algorithm; actuators; automatic motion sequence generation; computational complexity; error recovery; optimal shortest path; parallel path divergence; parallel path divergences; plant information; programmable logic control; real-time A* algorithm; sequential path; suboptimal motion sequence; suboptimal sequential path; Actuators; Automatic generation control; Automatic logic units; Computational modeling; Concurrent computing; Error correction; Motion control; Programmable control; Programmable logic arrays; Programmable logic devices;
Conference_Titel :
Emerging Technologies and Factory Automation, 2001. Proceedings. 2001 8th IEEE International Conference on
Conference_Location :
Antibes-Juan les Pins, France
Print_ISBN :
0-7803-7241-7
DOI :
10.1109/ETFA.2001.997668