Title :
Trends in testing integrated circuits
Author :
Vermeulen, Bart ; Hora, Camelia ; Kruseman, Bram ; Marinissen, Erik Jan ; Van Rijsinge, Robert
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
Keywords :
automatic test equipment; design for testability; electronics industry; integrated circuit technology; integrated circuit testing; Philips; automatic test equipment; customer quality requirements; design complexity; design for testability; electronics industry; integrated circuit process technology; integrated circuit testing; test program development; test quality; Circuit testing; Costs; Integrated circuit technology; Integrated circuit testing; Laboratories; Manufacturing industries; Marine technology; Process design; Semiconductor device testing; Silicon;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387330
