• DocumentCode
    2448290
  • Title

    Analysis of parallel coolmos under saturation-mode operation

  • Author

    Ahmed, M.M.R. ; Mawby, P.A.

  • Author_Institution
    Warwick Univ., Coventry
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    551
  • Lastpage
    555
  • Abstract
    In this paper we study the parallel operation of power MOSFETs. Normally, being switches, they operate either in the cut-off region or in the linear region, thus acting as a switch. However, in some fault conditions it is necessary for the MOSFET to be used to limit the current, in which case the device may operate in the saturation region. The MOSFET can only operate in this region for a finite amount of time, as is limited by thermal considerations. Specifically in this paper we study the parallel operation of CoolMOS devices using stat-of-the-art electrothermal models implemented in SABER. The simulation results reported in this paper offer a valuable insight into the parallel operation of super junction MOSFETs operating in the saturationmode operation. By varying the properties of one of the MOSFETs in parallel, the effect on system thermal stability is explored and hence is used to enhance the reliability of such paralleled devices.
  • Keywords
    power MOSFET; thermal stability; parallel CoolMOS; power MOSFET; saturation-mode operation; thermal stability; Circuits; Electrothermal effects; MOSFETs; Power dissipation; Power system reliability; Switches; Temperature; Thermal stability; Thermal stresses; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758013
  • Filename
    4758013