DocumentCode
2448290
Title
Analysis of parallel coolmos under saturation-mode operation
Author
Ahmed, M.M.R. ; Mawby, P.A.
Author_Institution
Warwick Univ., Coventry
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
551
Lastpage
555
Abstract
In this paper we study the parallel operation of power MOSFETs. Normally, being switches, they operate either in the cut-off region or in the linear region, thus acting as a switch. However, in some fault conditions it is necessary for the MOSFET to be used to limit the current, in which case the device may operate in the saturation region. The MOSFET can only operate in this region for a finite amount of time, as is limited by thermal considerations. Specifically in this paper we study the parallel operation of CoolMOS devices using stat-of-the-art electrothermal models implemented in SABER. The simulation results reported in this paper offer a valuable insight into the parallel operation of super junction MOSFETs operating in the saturationmode operation. By varying the properties of one of the MOSFETs in parallel, the effect on system thermal stability is explored and hence is used to enhance the reliability of such paralleled devices.
Keywords
power MOSFET; thermal stability; parallel CoolMOS; power MOSFET; saturation-mode operation; thermal stability; Circuits; Electrothermal effects; MOSFETs; Power dissipation; Power system reliability; Switches; Temperature; Thermal stability; Thermal stresses; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758013
Filename
4758013
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