DocumentCode :
2448369
Title :
Modular extension of ATE to 5 Gbps
Author :
Keezer, D.C. ; Minier, D. ; Paradis, M. ; Binette, F.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
748
Lastpage :
757
Abstract :
Existing digital automated test equipment (ATE) can provide signals at about 1 Gbps or slightly higher. To accommodate multi-GHz test needs, some ATE provide options for a few faster channels (up to 3.6 Gbps). However, leading-edge parts may require 100s of these signals and in some cases at even higher speeds (5 and 10 Gbps). This work describes a modular approach that allows for as many as 144 multiplexing and/or sampling channels to be added to existing ATE. The modules developed, so far include multiplexers, demultiplexers, and high-speed samplers that each support multiple high-speed differential signals. Production units operating up to 2.5 Gbps were introduced. We provide more detailed characterization of these modules and describe new modules targeting 3.2 Gbps and 5.0 Gbps applications. Various re-clocking techniques and proprietary calibration methods are used in order to reduce timing errors (especially jitter) to the sub-50ps range. The general system configuration, and key features of the newly developed modules are presented.
Keywords :
automatic test equipment; calibration; demultiplexing equipment; multiplexing equipment; timing jitter; 100 s; 3.2 Gbit/s; 5 Gbit/s; calibration methods; demultiplexers; digital ATE modular extension; digital automated test equipment; high speed samplers; jitter; multiGHz test; multiple high speed differential signals; multiplexers; multiplexing channels; production units; reclocking techniques; sampling channels; system configuration; timing errors reduction; Accuracy; Automatic testing; Calibration; Circuit testing; Jitter; Production; Sampling methods; System testing; Test equipment; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1387337
Filename :
1387337
Link To Document :
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