• DocumentCode
    2448917
  • Title

    Elimination of transistor’s switching losses by diode reverse recovery in dedicated application

  • Author

    Frivaldsky, M. ; Sul, R.

  • Author_Institution
    Univ. of Zilina, Zilina
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    737
  • Lastpage
    742
  • Abstract
    This paper deals with reverse recovery effect of various diodespsila structures and its elimination in dedicated applications. In principle it deals with the commutation process between transistorpsilas turn-on and diodepsilas turn-off in DC/DC converters. Quantification of received data was based on experimental measurements and consequently was converted into continuous form for graphic interpretation in dependence on switching frequency, supply voltage and load current. Accordingly, the utilization of new progressive materials of power semiconductor devices based on SiC technology is being described. It is concerned SiC Schottky Barrier Rectifiers diode structures versus Si UltraFast and HyperFast diodes rated for 600 V. From measurements is clear to say that selection of suitable diode could perfectly eliminate almost all of the turn - on losses without usage of soft - commutation. However the limiting factors of diode selection further remains parameters of power circuit as well as switching frequency whereby from measurements results that by influence of worser dynamic properties of diodes at low frequencies the losses will be plumbless.
  • Keywords
    DC-DC power convertors; Schottky diodes; semiconductor diodes; silicon; switching circuits; transistors; DC/DC converter; Si hyperfast diodes; Si ultrafast diodes; SiC Schottky barrier rectifiers diode structure; SiC technology; commutation process; continuous form; dedicated application; diode reverse recovery; diode selection; diode structures; experimental measurement; graphic interpretation; load current; power circuit; power semiconductor devices; reverse recovery effect; supply voltage; switching frequency; transistor switching losses; Current measurement; DC-DC power converters; Frequency measurement; Graphics; Loss measurement; Schottky diodes; Semiconductor diodes; Silicon carbide; Switching frequency; Switching loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758045
  • Filename
    4758045