• DocumentCode
    2449029
  • Title

    Precise pulse width measurement in write pre-compensation test

  • Author

    Okawara, Hideo

  • Author_Institution
    Agilent Technol. Int. Ltd., Tokyo, Japan
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    972
  • Lastpage
    979
  • Abstract
    Bit density on platters in hard disk drives gets so crowded that the signal stream read out of the magnetic media involves inter-symbol interference. In order to reduce the effect write data timing is tweaked according to specific bit patterns. This "write pre-compensation" is a tiny pulse width modification. Device manufacturers test this functionality by generating a special clock stream whose pulse width is very narrow. Time interval analyzers (TIA) can measure this pulse width precisely. However, the drawback of this is the requirement of a wide analog bandwidth and the need to compensate for a DC signal offset. Compared to a TIA approach, the use of a waveform sampler is shown to be simple, less costly and provides an appropriate capability. This article describes that phase increments of the fundamental frequency component can indicate pulse width increments. A data processing based on fast Fourier transform is described. DC shift has no influence in this method. A measurement instrument does not need a wide analog bandwidth.
  • Keywords
    disc drives; fast Fourier transforms; hard discs; intersymbol interference; magnetic heads; pulse measurement; DC signal offset; analog bandwidth; bit density; clock stream generation; data processing; device manufacturers; fast Fourier transform; frequency component; hard disk drives; intersymbol interference; magnetic media; pulse width increments; pulse width measurement; pulse width modification; time interval analyzers; waveform sampler; write data timing; write precompensation test; Bandwidth; Hard disks; Interference; Manufacturing; Pulse generation; Pulse measurements; Space vector pulse width modulation; Streaming media; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387362
  • Filename
    1387362