Title :
Model and verification of triple-well shielding on substrate noise in mixed-signal CMOS ICs
Author :
Rossi, Roberto ; Torelli, Guido ; Liberali, Valentino
Author_Institution :
Dept. of Electron., Pavia Univ., Italy
Abstract :
In this work, the effect of triple-well shielding in mixed signal CMOS integrated circuits is studied. A test chip is presented that contains structures intended for investigation on substrate noise coupling. This paper shows experimental results, giving a rationale for them and providing design guidelines.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; mixed-signal CMOS IC; substrate noise coupling; test chip; triple-well shielding; CMOS technology; Circuit noise; Circuit testing; Clocks; Frequency; Integrated circuit noise; MOS devices; Noise measurement; Semiconductor device modeling; Substrates;
Conference_Titel :
Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7995-0
DOI :
10.1109/ESSCIRC.2003.1257217
