Title :
A modular wrapper enabling high speed BIST and repair for small wide memories
Author :
Aitken, Robert C.
Author_Institution :
Artisan Components, Sunnyvale, CA, USA
Abstract :
This work describes a modular design of a wrapper enabling BIST/BISR for small memories operating as register files or FIFOs in high speed applications such as graphics and networking. The wrapper allows for at-speed test at low overhead and enables a simple repair scheme when millions of bits are used in such memories. The wrapper is intended to provide a standardized interface between memory and test controller, and thus work with any BIST controller, and communication between the two is minimized and at a reduced frequency.
Keywords :
built-in self test; high-speed integrated circuits; integrated circuit design; integrated circuit testing; integrated memory circuits; logic testing; FIFO; high speed BISR; high speed BIST controller; high speed applications; integrated circuit testing; logic testing; modular wrapper design; register files; small wide memories; test controller; wrapper at-speed test; Argon; Built-in self-test; Circuit testing; Communication system control; Costs; Fuses; Logic circuits; Logic testing; Multiplexing; Random access memory;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387365
