DocumentCode :
2449216
Title :
Yellowing reaction in encapsulant of photovoltaic modules
Author :
Shigekuni, T. ; Kumano, M.
Author_Institution :
Quality Assurance Organ., Shizuoka-Ken, Japan
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
1221
Lastpage :
1223
Abstract :
To clarify the mechanism of the yellowing reaction in encapsulant used for photovoltaic (PV) modules, a low molecular weight substance in EVA (ethylene vinyl acetate) under accelerated weathering tests (Dew cycle test, 1000 hours) with yellow change and virgin EVA were extracted with methanol. Extracts were chemically analyzed by GCIR (gas chromatography infrared-ray spectroscopic analysis), GC-AED (gas chromatography atomic emission detector), and FDMS (field desorption mass spectroscopy). The conditions of this accelerated test were based on JIS-K9117. The analysis results showed that 2,6 di-t-butyl-4-methyl phenol of antioxidant and 2-hydroxy-4-octoxy-benzophenone of UV absorbent were consumed after the weathering test and that 3,5-di-t-butyl-4-hydroxybenzaldehyde having yellow color was newly produced. A mechanism of the yellowing reaction in encapsulant was presented here that 2,6 di-t-butyl-4-methyl-phenol was oxidized by the N-O from Bis-2,2,6,6-tetramethyl-4-Piperidinyl sebacate to produce 3,5 di-t-butyl-4-hydroxy benzaldehyde
Keywords :
atomic emission spectroscopy; chromatography; encapsulation; infrared spectroscopy; life testing; polymer blends; semiconductor device testing; solar cell arrays; JIS-K9117; accelerated weathering tests; ethylene vinyl acetate; field desorption mass spectroscopy; gas chromatography atomic emission detector; gas chromatography infrared-ray spectroscopic analysis; photovoltaic module encapsulants; yellowing reaction; Atomic measurements; Chemical analysis; Gas chromatography; Infrared detectors; Life estimation; Mass spectroscopy; Methanol; Photovoltaic systems; Solar power generation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654309
Filename :
654309
Link To Document :
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