• DocumentCode
    244943
  • Title

    Anomaly Detection Using the Poisson Process Limit for Extremes

  • Author

    Luca, Stijn ; Karsmakers, Peter ; Vanrumste, Bart

  • Author_Institution
    Dept. of Electr. Eng., KU Leuven, Leuven, Belgium
  • fYear
    2014
  • fDate
    14-17 Dec. 2014
  • Firstpage
    370
  • Lastpage
    379
  • Abstract
    Anomaly detection starts from a model of normal behavior and classifies departures from this model as anomalies. This paper introduces a statistical non-parametric approach for anomaly detection that is based on a multivariate extension of the Poisson point process model for univariate extremes. The method is demonstrated on both a synthetic and a real-world data set, the latter being an unbalanced data set of acceleration data collected from movements of 7 pediatric patients suffering from epilepsy that is previously studied in [1]. The positive predictive values could be improved with an increase up to 12.9% (and a mean of 7%) while the sensitivity scores stayed unaltered. The proposed method was also shown to outperform an one-class SVM classifier. Because the Poisson point process model of extremes is able to combine information on the number of excesses over a fixed threshold with that on the excess values, a powerful model to detect anomalies is obtained that can be of high value in many applications.
  • Keywords
    nonparametric statistics; security of data; stochastic processes; Poisson point process model; anomaly detection; epilepsy; fixed threshold; multivariate extension; one-class SVM classifier; pediatric patients; positive predictive values; real-world data set; sensitivity scores; statistical nonparametric approach; synthetic data set; unbalanced data set; univariate extremes; Brain modeling; Data models; Estimation; Hidden Markov models; Kernel; Testing; Vectors; Poisson point process; anomaly detection; extreme value statistics; semi-supervised; unbalanced data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining (ICDM), 2014 IEEE International Conference on
  • Conference_Location
    Shenzhen
  • ISSN
    1550-4786
  • Print_ISBN
    978-1-4799-4303-6
  • Type

    conf

  • DOI
    10.1109/ICDM.2014.12
  • Filename
    7023354