DocumentCode
2449669
Title
STATCOM control with Instantaneous Phase-locked Loop for performance improvement under single-line to ground fault
Author
Xi, Zhengping ; Bhattacharya, Subhashish
Author_Institution
Semicond. Power Electron. Center, North Carolina State Univ., Raleigh, NC
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
971
Lastpage
976
Abstract
The STATCOM (Synchronous Static Compensator) based on VSC (Voltage Source Converter) is used for voltage regulation in transmission and distribution systems. The STATCOM can rapidly generate or absorb dynamic reactive power during system faults for voltage regulation. Strict requirements of STATCOM loss and total system loss penalty preclude the use of PWM (Pulse-Width Modulation) for STATCOM applications. The commonly- implemented PLL (Phase-locked Loop) in the system, which is based on positive-sequence bus voltage, can not response to dynamical changing of negative-sequence bus voltage due to system faults. These constraints result in over-currents and trips of the STATCOM during system faults. In this paper, we propose and develop an ldquoInstantaneous PLLrdquo to prevent over-currents (and trips) in the VSC during single-line to ground system faults, and to ensure that the STATCOM supplies required reactive power.
Keywords
overcurrent protection; phase locked loops; power convertors; reactive power; static VAr compensators; voltage control; Instantaneous phase-locked loop; STATCOM control; dynamic reactive power; pulse-width modulation; single-line to ground fault; synchronous static compensator; system faults; voltage regulation; voltage source converter; Automatic voltage control; Converters; Phase locked loops; Power conversion; Power generation; Pulse width modulation; Reactive power; STATCOM; Space vector pulse width modulation; Voltage control; Phase-locked Loop (PLL); Pulse-Width Modulation (PWM); Synchronous Static Compensator (STATCOM); Voltage Source Converter (VSC); single-line to ground fault (SLG);
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758085
Filename
4758085
Link To Document