DocumentCode :
2449856
Title :
High spatial resolution dielectric constant uniformity measurements using microstrip resonant probes
Author :
Wang, M. ; Bothra, S. ; Borrego, J. ; Kristal, K.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1990
fDate :
8-10 May 1990
Firstpage :
1121
Abstract :
Microstrip resonant probes have been developed which can measure dielectric constant uniformity with spatial resolution of 0.030 in.*0.010 in. and accuracy better than 2% at 10 GHz. The accuracy of the measurement can be improved to be better than 1% by using a closed-loop frequency discriminator to measure the frequency shift automatically. The measurement principle, microstrip resonator design and fabrication, microwave measurement setup, and dielectric constant uniformity measurement are discussed.<>
Keywords :
microwave measurement; permittivity measurement; probes; resonators; strip line components; 10 GHz; SHF; closed-loop frequency discriminator; dielectric constant uniformity measurements; fabrication; frequency shift; high spatial resolution; microstrip resonant probes; microstrip resonator design; microwave measurement setup; Dielectric constant; Dielectric measurements; Fabrication; Frequency measurement; High-K gate dielectrics; Microstrip resonators; Microwave measurements; Probes; Resonance; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
Type :
conf
DOI :
10.1109/MWSYM.1990.99776
Filename :
99776
Link To Document :
بازگشت