Title :
Ups and Downs in Buzzes: Life Cycle Modeling for Temporal Pattern Discovery
Author :
Yi Chang ; Yamada, Makoto ; Ortega, Antonio ; Yan Liu
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Abstract :
In social media analysis, one critical task is detecting burst of topics or buzz, which is reflected by extremely frequent mentions of certain key words in a short time interval. Detecting buzz not only provides useful insights into the information propagation mechanism, but also plays an essential role in preventing malicious rumors. However, buzz modeling is a challenging task because a buzz time-series usually exhibits sudden spikes and heavy tails, which fails most existing time-series models. To deal with buzz time-series sequences, we propose a novel time-series modeling approach which captures the rise and fade temporal patterns via Product Life Cycle (PLC) models, a classical concept in economics. More specifically, we propose a mixture of PLC models to capture the multiple peaks in buzz time-series and furthermore develop a probabilistic graphical model (K-MPLC) to automatically discover inherent life cycle patterns within a collection of buzzes. Our experiment results show that our proposed method significantly outperforms existing state-of-the-art approaches on buzzes clustering.
Keywords :
pattern clustering; product life cycle management; social networking (online); text analysis; time series; K-MPLC; PLC models; buzz detection; buzz modeling; buzz time-series sequences; buzzes clustering; information propagation mechanism; key words frequent mentions; life cycle patterns; malicious rumors prevention; probabilistic graphical model; product life cycle modeling; social media analysis; temporal pattern discovery; time series clustering; time-series modeling; Biological system modeling; Clustering algorithms; Graphical models; Measurement; Media; Optimization; Probabilistic logic; Time-Series Clustering; Time-Series Modeling;
Conference_Titel :
Data Mining (ICDM), 2014 IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4799-4303-6
DOI :
10.1109/ICDM.2014.28