DocumentCode
2450331
Title
Test scheduling for network-on-chip with BIST and precedence constraints
Author
Liu, Chunsheng ; Cota, Erika ; Sharif, Hamid ; Pradhan, D.K.
Author_Institution
Comput. & Electron. Eng, Nebraska-Lincoln Univ., Omaha, NE, USA
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
1369
Lastpage
1378
Abstract
Network-on-a-chip (NoC) is becoming a promising paradigm of core-based system. We propose a new method for test scheduling in NoC. The method is based on the use of a dedicated routing path for the test of each core. We show that test scheduling under this approach is NP-complete and present an ILP model for solving small NoC instances. For NoCs with larger number of cores, we present an efficient heuristic. We then improve the heuristic by including BISTs and precedence constraints. Experimental results for the ITC´02 SoC benchmarks show that the new method leads to substantial reduction on test application time compared to previous work. The inclusion of BIST tests and precedence constraints provides a comprehensive solution for test scheduling in NoC.
Keywords
built-in self test; constraint theory; integer programming; integrated circuit testing; linear programming; scheduling; system-on-chip; BIST test scheduling; ILP model; ITC02 SoC benchmarks; NP-complete problems; built in self test; core based system; heuristics algorithm; integer linear programming model; network-on-chip; precedence constraints; routing path; Bandwidth; Built-in self-test; Computer science; Integrated circuit testing; Job shop scheduling; Network-on-a-chip; Pipelines; Processor scheduling; Routing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387412
Filename
1387412
Link To Document