Title :
Impact of the magnetic cross-saturation in a sensorless Direct Torque controlled Synchronous Reluctance Machine based on test voltage signal injections
Author :
Morales-Caporal, Roberto ; Pacas, Mario
Author_Institution :
Tech. Inst. of Apizaco
Abstract :
This paper presents the impact of the magnetic cross-saturation in a sensorless Direct Torque Control (DTC) scheme for Synchronous Reluctance Machines (SynRMs). Due to the rotor saliency of the SynRM, the angular position of its rotor can be estimated by using inductance variations due to geometrical effects. This technique can be used at low and zero speeds of operation. However, the influence of the cross-saturation leads to a persistent error on the estimated angular position of the rotor. This error deteriorates the performance of the drive when the estimated position is used instead of the measured one in the control scheme. The aim of this paper is to present the impact of the position error as a function of the working point and to introduce a technique to minimize this problem in order to obtain a stable operation of the SynRM with load at very low speeds. Theoretical analysis is validated by experimental results, which have been obtained by using a DSP and a field programmable gate array based digital controllers and a SynRM of the transverse-laminated rotor type.
Keywords :
digital signal processing chips; electric drives; field programmable gate arrays; machine vector control; reluctance machines; rotors; torque control; DSP; angular position estimation; digital controllers; drive performance; field programmable gate array; magnetic cross-saturation; position error minimization technique; sensorless direct torque controlled machine; synchronous reluctance machine; test voltage signal injections; transverse-laminated rotor; Digital signal processing; Error correction; Field programmable gate arrays; Inductance; Position measurement; Reluctance machines; Sensorless control; Testing; Torque control; Voltage control;
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2008.4758131