• DocumentCode
    2450647
  • Title

    Testing a secure device: high coverage with very low observability

  • Author

    Sourgen, Laurent

  • Author_Institution
    STMicroelectron., France
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    1415
  • Abstract
    Secure microcontrollers used in smart card, are small, cost effective, system on chip including a mixtures of standard CPU, memories and dedicated functions added to protect the circuits against leakage or tampering. Testing the device require a high coverage while offering no access to internal information. Today solutions are based on combination of standard structural testing (scan) and functional testing. Both are usually using BIST solutions, based on hardware and firmware implementations. Secure devices includes special antileakage or antitampering dedicated functions.
  • Keywords
    built-in self test; integrated circuit testing; microcontrollers; system-on-chip; BIST; antileakage dedicated functions; antitampering dedicated functions; circuit protection; functional testing; microcontrollers; scan testing; secure device testing; smart card; standard structural testing; system on chip; Built-in self-test; Central Processing Unit; Circuit testing; Cost function; Hardware; Microcontrollers; Observability; Protection; Smart cards; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387423
  • Filename
    1387423