DocumentCode
2450647
Title
Testing a secure device: high coverage with very low observability
Author
Sourgen, Laurent
Author_Institution
STMicroelectron., France
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
1415
Abstract
Secure microcontrollers used in smart card, are small, cost effective, system on chip including a mixtures of standard CPU, memories and dedicated functions added to protect the circuits against leakage or tampering. Testing the device require a high coverage while offering no access to internal information. Today solutions are based on combination of standard structural testing (scan) and functional testing. Both are usually using BIST solutions, based on hardware and firmware implementations. Secure devices includes special antileakage or antitampering dedicated functions.
Keywords
built-in self test; integrated circuit testing; microcontrollers; system-on-chip; BIST; antileakage dedicated functions; antitampering dedicated functions; circuit protection; functional testing; microcontrollers; scan testing; secure device testing; smart card; standard structural testing; system on chip; Built-in self-test; Central Processing Unit; Circuit testing; Cost function; Hardware; Microcontrollers; Observability; Protection; Smart cards; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387423
Filename
1387423
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