DocumentCode :
2450684
Title :
The Behavior of Residual Impurities During the Crystal Growth of Tl3VS4(TVS)
Author :
Kun, Z.K. ; Weinert, B.W.
fYear :
1982
fDate :
27-29 Oct. 1982
Firstpage :
515
Lastpage :
518
Keywords :
Crystals; Electric resistance; Grain boundaries; Impurities; Inspection; Optical microscopy; Optical surface waves; Q measurement; Resonance; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1982 Ultrasonics Symposium
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/ULTSYM.1982.197880
Filename :
1534820
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2450684
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